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By: KLA Corporation
Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index, and surface profile of dielectric, semiconductor, and metal materials.
Status Alert: On Friday, May 12, 2023, the status for the FILMEASURE mark changed to SECTI ON 8- ACCE PTED .
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On Thursday, October 29, 2015, a U.S federal trademark application was filed for FILMEASURE by Filmetrics, Inc., 10655 Roselle Street, San Diego, CA. The USPTO has assigned the FILMEASURE mark the serial number 86804004. The FILMEASURE mark has been filed in the category Computer and Software Products and Electrical and Scientific Products. The owner of the FILMEASURE mark is listed as KLA Corporation, One Technology Drive, Milpitas, CA. The correspondent for the FILMEASURE mark is Ryan A. McGonigle Hodgson Russ LLP of 605 3rd Ave. Suite 2300, New York, NY 10158, UNITED STATES. If you have licensing, usage or other questions concerning the FILMEASURE mark, please contact the owner through the listed correspondent. The description provided for the FILMEASURE mark is Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index, and surface profile of dielectric, semiconductor, and metal materials. |
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| Word Mark: | FILMEASURE |
| Status: | SECTI ON 8- ACCE PTED |
| Status Date: | 05/12/2023 |
| Serial Number: | 86804004 |
| Filing Date: | 10/29/2015 |
| Registration Number: | 5070333 |
| Registration Date: | 10/25/2016 |
| Goods and Services: | Optical thin-film and surface measuring instruments, namely, systems comprised of computers, spectrometers, video cameras, lamps, fiber optic cables, lenses, and mechanical translation components sold as a unit, for measuring the thickness, deposition rate, refractive index, and surface profile of dielectric, semiconductor, and metal materials |
| Type Of Mark: | Trademark |
| Register Type: | Supplemental |
| Published For Opposition Date: | Not Available |
| Current Owner: | KLA Corporation One Technology Drive Milpitas, CA 95035 UNITED STATES |
| Mark Description: | Not Available |
| Mark Drawing Type: | Not Available |
| Design Search: | Not Available |
| Disclaimer: | Not Available |
| Correspondent: | Ryan A. McGonigle Hodgson Russ LLP 605 3rd Ave. Suite 2300 New York, NY 10158 UNITED STATES |
| International Class(es): | 009 |
| US Class(es): | 021, 023, 026, 036, 038 |
| Primary Class: | Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments; apparatus and instruments for conducting, switching, transforming, accumulating, regulating or controlling electricity; apparatus for recording, transmission or reproduction of sound or images; magnetic data carriers, recording discs; automatic vending machines and mechanisms for coin operated apparatus; cash registers, calculating machines, data processing equipment and computers; fire extinguishing apparatus. |
| Class(es) Status: | Active |
| First Use Anywhere: | 01/01/1997 |
| First Use In Commerce: | 01/01/1997 |
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